ToF-SIMS as a tool for analysing organic material in geological samples - Fluid inclusions and beyond
by
Sandra Siljeström(Stockholm University, Geochemistry)
→
Europe/Stockholm
De Geer salen (Geohuset)
De Geer salen
Geohuset
Description
In situ analysis of organic material in rocks has potential to answer questions
in geochemistry, astro- and geobiology. Recently, successful studies which
included in situ analyses of geological samples with time-of-flight secondary
ion mass spectrometry (ToF-SIMS) were carried out. In this PhD project
possibilities and limitations of ToF-SIMS analysis of organic material in
geological samples will be further explored.
The development of the approach for analysis of single oil-bearing inclusions
was done in a two-step process; i) a number of crude oils were analysed with
ToF-SIMS and GC-MS to facilitate interpretation of ToF-SIMS spectra of these
types of samples and, ii) a procedure that combines micrographs with ion etching
and ToF-SIMS analysis was developed for analysis of inclusions. With this
approach it was possible to detect hopanes and steranes in single oil-bearing
fluid inclusions. The next step of the project will be to analyse inclusions in
Precambrian rocks in search for hopanes and steranes. In addition to the
Precambrian samples, the capabilities of ToF-SIMS in analysis of geological
samples will be further explored with analysis of additional samples, including
Martian meteorites and microbial mats from hot springs in Yellowstone National
Park.
