Speaker
Description
In trapped-ion quantum computing, quantum logic gates are most commonly performed using lasers. Alternatively, gates can be performed electronically, for which the technology offers attractive features for scalability: robustness, cost and size, straightforward amplitude and phase control, and simple integration of waveguides onto surface traps. Additionally, electronically-controlled trapped-ions have been used to perform the highest fidelity single- (this work) [1] and two- [2,3] qubit gates of any platform.
In this work, we report the achievement of single-qubit gates with sub-part-per-million error rates in a trapped-ion $^{43}$Ca$^{+}$ hyperfine clock qubit [1]. We explore the speed/fidelity trade-off for gate times 4.4 ≤ t$_{g}$ ≤ 35 μs, and benchmark a minimum error per Clifford gate of $1.5(4) \times 10^{−7}$. Calibration errors are suppressed to < $10^{−8}$, leaving qubit decoherence (T$_{2}$ ≈ 70 s), leakage, and measurement as the dominant error contributions. Through further analysis, we identify the source of these errors to be noise in the microwave-drive chain, charting a path towards even higher fidelity operations.
[1] M.C. Smith, A. D. Leu, et al., Phys. Rev. Lett., 134, 230601 (2025)
[2] A. C. Hughes et. al., arXiv:2510.17286 (2025)
[3] R. Srinivas et. al., Nature, 597, 209-213 (2021)
| Academic level | PhD student |
|---|